Testing the logic cells and interconnect resources for FPGAs

Proceedings of the Asian Test Symposium

Volumn , Issue , 1999, Pages 369-374

  Doumar, Abderrahim ^a   Ito, Hideo ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONFIGURABLE LOGIC BLOCKS (CLB); STATIC RANDOM ACCESS MEMORY (SRAM);

INTEGRATED CIRCUIT TESTING; RANDOM ACCESS STORAGE;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 0033321656     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)

1. C. Stroud, S. Konala, P. Chen and M. Abramovici, "BUILT-in self-test of logics Blocks in FPGAs, " 14"" VLSI test symposium, pp. 387-392, 1996.
2. A. Doumar, T. Ohmameuda, and H. Ito, "Design of an Automatic Testing for FPGAs, " to appear in IEEE European Test Workshop. 1999, http://www.icsd2.tj.chiba-u.ac.Jp/~doumar/p029.ps.
3. A. Doumar and H. Ito, " Self-Testing and Diagnosis for SRAM-FPGAs, " accepted to appear in Pacific Rim International Sym. on Dependable Computing (PRDC), Hong Kong, Dec. 1999.
4. W. K. Huang, F. J. Meyer and F. Lombardi, "Testing Configurable LUT-Based FPGA's, " IEEE trans, on VLSI, Vol. 6, No. 2, pp. 276-283, June 1998.
5. W. K. Huang, F. J. Meyer and F. Lombardi, "Multiple fault detection in logic resources of FPGAs, " Defect and Fault Tolerance in VLSI Systems, pp. 186-194, 1997.
6. M. RenoveU, J. Figueras, and Y. Zorian, "Test of RAM-Based FPGA: Methodology and Application to the interconnect structure, " Proc. 15th IEEE VLSI Test symp., IEEE CS Press, pp. 204-209, 1997.
7. C. Stroud, S. Wijesuriya, C. Hamilton and M. Abramovici, "Built-in self-Test of FPGA Interconnect, " International Test Conference, pp. 404-411, 1998.
8. M. RenoveU, J. M. Portal, J. Figueras and Y. Zorian, "Testing the Interconnect of RAM-Based FPGAs", International Test Conference, pp. 45-50, 1998.
9. L. Zhao, D. M. walker and F. Lombardi, "Detection Of Bridging Faults In Logic Resources of Configurable FPGA Using Iddq, " International Test Conference, pp. 1037-1046, 1998.