Concurrent checking for VLSI

Microelectronic Engineering

Volumn 49, Issue 1, 1999, Pages 139-156

  Nicolaidis, M ^a   Anghel, L ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONCURRENCY CONTROL; FAULT TOLERANT COMPUTER SYSTEMS; INTEGRATED CIRCUIT TESTING; VLSI CIRCUITS;

SELF-CHECKING CIRCUITS;

MICROELECTRONICS;

EID: 0033225350     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(99)00435-9     Document Type: Article

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