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Volumn , Issue , 1998, Pages 1140-
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Design for soft-error robustness to rescue deep submicron scaling
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER AIDED DESIGN;
DESIGN FOR TESTABILITY;
ERROR ANALYSIS;
RANDOM ACCESS STORAGE;
TRANSISTORS;
VLSI CIRCUITS;
DEEP SUBMICRON SCALING;
ERROR DETECTING AND CORRECTING CODES (EDAC);
SOFT-ERROR ROBUSTNESS;
INTEGRATED CIRCUIT TESTING;
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EID: 0032308112
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (32)
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References (0)
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