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Volumn 12, Issue 1-2, 1998, Pages 63-68

Design of self-testing checkers for m-out-of-n codes using parallel counters

Author keywords

Concurrent error detection; Counters of 1s; M out of n (m n) codes; On line testing; Parallel counters; Self checking circuit; Self testing checker; Unidirectional errors; Unordered codes

Indexed keywords

ADDERS; CODES (SYMBOLS); COUNTING CIRCUITS; ERROR DETECTION; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; ONLINE SYSTEMS;

EID: 0032000322     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1008273606127     Document Type: Article
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.