On-line detection of logic errors due to crosstalk, delay, and transient faults

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 524-533

  Metra, Cecilia ^a   Favalli, Michele ^a   Ricco, Bruno ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; ERROR DETECTION; FAILURE ANALYSIS; LOGIC CIRCUITS; VLSI CIRCUITS;

ONLINE DETECTION;

INTEGRATED CIRCUIT TESTING;

EID: 0032317504     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)