Fault-secure parity prediction arithmetic operators

IEEE Design and Test of Computers

Volumn 14, Issue 2, 1997, Pages 60-71

  Nicolaidis, Michael ^a,c,d,e,f   Duarte, Ricardo O ^a,g,h   Manich, Salvador ^b,i   Figueras, Joan ^b,i,j,k  

^a TIMA LABORATORY   (France)

^b UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^c CNRS   (France)

^d TIMA Laboratory ^*  (France)

^e ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^f GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

^g FEDERAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^h Federal University of Rio de Janeiro ^*  (Brazil)

ⁱ IEEE

^j UNIVERSITY OF MICHIGAN   (United States)

^k Systems Engineering Laboratory

more..

Author keywords

[No Author keywords available]

Indexed keywords

ADDERS; CODES (SYMBOLS); CODING ERRORS; ERROR DETECTION; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL OPERATORS; THEOREM PROVING;

FAULT SECURENESS; PARITY CODES; PARITY PREDICTION ARITHMETIC OPERATORS;

DIGITAL ARITHMETIC;

EID: 0031122540     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.587743     Document Type: Article

References (8)

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2. F.F. Sellers, M.-Y. Hsiao, and L.W. Beamson, Error Detecting Logic for Digital Computers, McGraw-Hill, New-York, 1968.
3. U. Sparmann, "On the Check Base Selection Problem for Fast Adders," Proc. 11th VLSI TestSymp., IEEE Computer Society Press, Los Alamitos, Calif., 1993, pp. 62-65.
4. U. Sparmann and S.M. Reddy, "On the Effectiveness of Residue Code Checking for Parallel Two's Complement Multipliers," Proc. 24th Fault-Tolerant Computing Symp., IEEE CS Press, 1994, pp. 219-228.
5. K. Hwang, Computer Arithmetic, Principles, Architecture and Design, John Wiley & Sons, New York, 1979.
6. I. Koren, Computer Arithmetic Algorithms, Prentice-Hall, Englewood Cliffs, N.J., 1993.
7. M. Nicolaidis, "Efficient Implementation of Self-Checking Adders and ALUs," Proc. 23rd Fault-Tolerant Computing Symp., IEEE CS Press, 1993, pp. 586-595.
8. R.O. Duarte et al., "Efficient Fault-Secure Shifter Design," Proc. European Design and Test Conf., IEEE CS Press, 1997 pp. 335-341.