Extremely scaled double-gate CMOS performance projections, including GIDL-controlled off-state current

IEEE Transactions on Electron Devices

Volumn 46, Issue 11, 1999, Pages 2195-2200

  Possum, Jerry G ^a   Kim, Keunwoo ^a   Chong, Yan ^a  

^a University of Florida   (United States)

Author keywords

Double gate mosfet's; GIDL; Off state current; Scaled cmos

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; LEAKAGE CURRENTS; OPTIMIZATION;

GATE-INDUCED DRAIN LEAKAGE (GIDL); OFF-STATE CURRENTS;

MOSFET DEVICES;

EID: 0033221550     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.796296     Document Type: Article

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