Simulation-based assessment of 50 nm double-gate SOI CMOS performance

IEEE International SOI Conference

Volumn , Issue , 1998, Pages 107-108

  Fossum, Jerry G ^a   Chong, Yan ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; GATES (TRANSISTOR); SEMICONDUCTOR DEVICE MODELS; THRESHOLD VOLTAGE;

SOFTWARE PACKAGE SOISPICE;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0032306225     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)