A solution to the next best view problem for automated surface acquisition

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 21, Issue 10, 1999, Pages 1016-1030

  Pito, Richard ^a  

^a Invenio Technologies Co   (United States)

Author keywords

Active vision; Automated surface acquisition; Model acquisition; Next best view; Range imaging; Reverse engineering; Sensor planning

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER VISION; CONSTRAINT THEORY; DATA ACQUISITION; DATA STRUCTURES; IMAGE SENSORS; MATHEMATICAL MODELS; PROBLEM SOLVING; REVERSE ENGINEERING; SCANNING;

AUTOMATED SURFACE ACQUISITION; MODEL ACQUISITION; NEXT BEST VIEW PROBLEM; POSITIONAL SPACE;

IMAGE ANALYSIS;

EID: 0033211165     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.799908     Document Type: Article

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