Ivis: An integrated volumetric inspection system

Computer Vision and Image Understanding

Volumn 61, Issue 3, 1995, Pages 430-444

  Tarbox, G H ^a   Gottschlich, S N ^a  

^a Analytic Sciences Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0029305559     PISSN: 10773142     EISSN: None     Source Type: Journal    
DOI: 10.1006/cviu.1995.1032     Document Type: Article

References (35)

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