Planning for complete sensor coverage in inspection

Computer Vision and Image Understanding

Volumn 61, Issue 1, 1995, Pages 84-111

  Tarbox, G H ^a   Gottschlich, S N ^a,b  

^a Analytic Sciences Corporation   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; IMAGE PROCESSING; IMAGE SENSORS; INSPECTION; SURFACE MEASUREMENT;

COMPLETE SENSOR COVERAGE; PLANNING ALGORITHMS;

COMPUTER VISION;

EID: 0029203832     PISSN: 10773142     EISSN: 1090235X     Source Type: Journal    
DOI: 10.1006/cviu.1995.1007     Document Type: Article

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