Polystyrene spheres on mica substrates: AFM calibration, tip parameters and scan artefacts

Journal of Microscopy

Volumn 181, Issue 1, 1996, Pages 2-9

  Van Cleef, M ^a   Holt, S A ^a   Watson, G S ^a   Myhra, S ^a  

^a GRIFFITH UNIVERSITY   (Australia)

Author keywords

Force microscopy; Noncontact mode; Polystyrene spheres; Scan artefacts; Tip parameters

Indexed keywords

CALIBRATION; MICA; POLYSTYRENES; SURFACE TOPOGRAPHY;

ATOMIC-FORCE-MICROSCOPY; FORCE MICROSCOPY; MICA SUBSTRATES; MICROSCOPY IMAGES; NONCONTACT MODES; POLYSTYRENE SPHERES; SCAN ARTIFACT; STRUCTURAL TOOLS; TIP PARAMETER; TIP SHAPE;

ATOMIC FORCE MICROSCOPY;

POLYSTYRENE;

ARTICLE; ATOMIC FORCE MICROSCOPY; PRIORITY JOURNAL;

EID: 0030033389     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1996.74351.x     Document Type: Article

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