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Volumn 46, Issue 5, 1999, Pages 840-849

Degradation of dc characteristics of InGaAs/InP single heterojunction bipolar transistors under electron irradiation

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; ELECTRON IRRADIATION; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DEVICE MODELS;

EID: 0032663672     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.760388     Document Type: Article
Times cited : (18)

References (14)
  • 10
    • 36449003510 scopus 로고    scopus 로고
    • Calculation of the base current components and determination of their relative importance in AlGaAs/GaAs and InAlAs/InGaAs heterojunction bipolar transistors
    • J. J. Liou Calculation of the base current components and determination of their relative importance in AlGaAs/GaAs and InAlAs/InGaAs heterojunction bipolar transistors J. Appl. Phys. vol. 69 pp. 3328-3334 1991.
    • J. Appl. Phys. Vol. 69 Pp. 3328-3334 1991.
    • Liou, J.J.1
  • 11
    • 0001449473 scopus 로고    scopus 로고
    • Super-gain AlGaAs/GaAs heterojunction bipolar transistors using an emitter edge-thinning design
    • H. Lin and S. Lee Super-gain AlGaAs/GaAs heterojunction bipolar transistors using an emitter edge-thinning design Appl. Phys. Lett. vol. 47 pp. 839-841 1985.
    • Appl. Phys. Lett. Vol. 47 Pp. 839-841 1985.
    • Lin, H.1    Lee, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.