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Volumn 35, Issue 6, 1988, Pages 1657-1661

Neutron irradiation effects on AlGaAs/GaAs heterojunction bipolar transistors

Author keywords

[No Author keywords available]

Indexed keywords

NEUTRONS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICES--HETEROJUNCTIONS;

EID: 0024169258     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.25516     Document Type: Article
Times cited : (24)

References (15)
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  • 5
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    • S.L. Su, R. Fischer, W.G. Lyons, O. Tejayadi, D. Arnold, J. Klem, and H. Morkoc, “Double heterojunction GaAs/Alx Ga1-x As bipolar transistors prepared by molecular beam epitaxy,” J. Appl. Phys., vol. 54, no. 11, pp. 6725–6731, 1983.
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    • Su, S.L.1    Fischer, R.2    Lyons, W.G.3    Tejayadi, O.4    Arnold, D.5    Klem, J.6    Morkoc, H.7
  • 7
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    • Intrinsic SEU reduction from use of heterojunctions in gallium arsenide bipolar circuits
    • J.F. Salzman, P.J. McNulty, and A.R. Knudson, “Intrinsic SEU reduction from use of heterojunctions in gallium arsenide bipolar circuits,” IEEE Trans. Nucl. Sci., vol. NS-34, no. 6, pp. 1676–1679, 1987.
    • (1987) IEEE Trans. Nucl. Sci. , vol.NS-34 , Issue.6 , pp. 1676-1679
    • Salzman, J.F.1    McNulty, P.J.2    Knudson, A.R.3
  • 8
    • 30244526255 scopus 로고
    • Radiation effects in high electron mobility transistors: total dose gamma irradiation
    • M.J. O'Loughlin, “Radiation effects in high electron mobility transistors: total dose gamma irradiation,” IEEE Trans. Nucl. Sci., vol. NS-34, no. 6, pp. 1808–1811, 1987.
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    • O'Loughlin, M.J.1
  • 9
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    • Ionizing radiation hardness of GaAs technologies
    • M.A. Listvan, P.J. Vold, and D.K. Arch, “Ionizing radiation hardness of GaAs technologies,” IEEE Trans. Nucl. Sci., vol. NS-34, no. 6, pp. 1664–1668, 1987.
    • (1987) IEEE Trans. Nucl. Sci. , vol.NS-34 , Issue.6 , pp. 1664-1668
    • Listvan, M.A.1    Vold, P.J.2    Arch, D.K.3
  • 11
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    • Radiation testing of linear processes at Harris Custom Integrated Circuits Division
    • to be published in the Proceedings of the DNA/HDL Workshop on Test Structures for Semiconductor Device Radiation Hardening and Hardness Assurance, Hawthorne, CA, April 7
    • J.A. Delgado, and S.J. Gaul, “Radiation testing of linear processes at Harris Custom Integrated Circuits Division,” to be published in the Proceedings of the DNA/HDL Workshop on Test Structures for Semiconductor Device Radiation Hardening and Hardness Assurance, Hawthorne, CA, April 7, 1988.
    • (1988)
    • Delgado, J.A.1    Gaul, S.J.2
  • 12
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    • An (A1, Ga)As/GaAs heterostructure bipolar transistor with nonalloyed graded-gap ohmic contacts to the base and emitter
    • M.A. Rao, E.J. Caine, S.I. Long, and H. Kroemer, “An (A1,Ga)As/GaAs heterostructure bipolar transistor with nonalloyed graded-gap ohmic contacts to the base and emitter,” IEEE Electron Device Letters, vol. EDL-8, no. 1, pp. 30–32, 1987.
    • (1987) IEEE Electron Device Letters , vol.EDL-8 , Issue.1 , pp. 30-32
    • Rao, M.A.1    Caine, E.J.2    Long, S.I.3    Kroemer, H.4
  • 13
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    • Super-gain AlGaAs/GaAs heterojunction bipolar transistors using an emitter edge-thinning design
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.