-
2
-
-
0027558366
-
Comparison of 6H-SiC, 3C-SiC and Si for power devices
-
Bhatnagar M., Baliga B.J. Comparison of 6H-SiC, 3C-SiC and Si for power devices. IEEE Trans. Elec. Dev. 40:1993;645-655.
-
(1993)
IEEE Trans. Elec. Dev.
, vol.40
, pp. 645-655
-
-
Bhatnagar, M.1
Baliga, B.J.2
-
3
-
-
0028485013
-
Wide bandgap semiconductors for superior high voltage unipolar devices
-
Chow T.P., Tyagi R. Wide bandgap semiconductors for superior high voltage unipolar devices. IEEE Trans. Elec. Dev. 41:1994;1481-1483.
-
(1994)
IEEE Trans. Elec. Dev.
, vol.41
, pp. 1481-1483
-
-
Chow, T.P.1
Tyagi, R.2
-
5
-
-
0031102997
-
Positive temperature coefficient of breakdown voltage in 4H-SiC p-n junction rectifiers
-
Neudeck P.G., Fazi C. Positive temperature coefficient of breakdown voltage in 4H-SiC p-n junction rectifiers. IEEE Elec. Dev. Lett. 18:1997;96-98.
-
(1997)
IEEE Elec. Dev. Lett.
, vol.18
, pp. 96-98
-
-
Neudeck, P.G.1
Fazi, C.2
-
8
-
-
0029345172
-
The guard ring termination for the high voltage SiC Schottky barrier diodes
-
Ueno K., Urushidani T., Hashimoto K., Seki Y. The guard ring termination for the high voltage SiC Schottky barrier diodes. IEEE Elec. Dev. Lett. 16:1995;331.
-
(1995)
IEEE Elec. Dev. Lett.
, vol.16
, pp. 331
-
-
Ueno, K.1
Urushidani, T.2
Hashimoto, K.3
Seki, Y.4
-
9
-
-
0029327757
-
High performance of high voltage 4H-SiC Schottky Barrier diodes
-
Itoh A., Kimoto T., Matsunami H. High performance of high voltage 4H-SiC Schottky Barrier diodes. IEEE Elec. Dev. Lett. 16:1995;280-282.
-
(1995)
IEEE Elec. Dev. Lett.
, vol.16
, pp. 280-282
-
-
Itoh, A.1
Kimoto, T.2
Matsunami, H.3
-
11
-
-
0030107490
-
Excellent reverse blocking characteristics of high voltage 4H-SiC Schottky rectifiers with boron implanted edge termination
-
Itoh A., Kimoto T., Matsunami H. Excellent reverse blocking characteristics of high voltage 4H-SiC Schottky rectifiers with boron implanted edge termination. IEEE Elec. Dev. Lett. 17:1996;139-141.
-
(1996)
IEEE Elec. Dev. Lett.
, vol.17
, pp. 139-141
-
-
Itoh, A.1
Kimoto, T.2
Matsunami, H.3
-
12
-
-
0032023793
-
P-type 4H and 6H-SiC high voltage Schottky barrier diodes
-
Raghunathan R., Baliga B.J. P-type 4H and 6H-SiC high voltage Schottky barrier diodes. IEEE Elec. Dev. Lett. 19:1998;71-73.
-
(1998)
IEEE Elec. Dev. Lett.
, vol.19
, pp. 71-73
-
-
Raghunathan, R.1
Baliga, B.J.2
-
13
-
-
0032046055
-
A Dual metal trench Schottky pinch rectifier in 4H-SiC
-
Schoen K.J., et al. A Dual metal trench Schottky pinch rectifier in 4H-SiC. IEEE Elec. Dev. Lett. 19:1998;97-99.
-
(1998)
IEEE Elec. Dev. Lett.
, vol.19
, pp. 97-99
-
-
Schoen, K.J.1
-
14
-
-
0030270893
-
Trends in power semiconductor devices
-
Baliga B.J. Trends in power semiconductor devices. IEEE Trans. Elec. Dev. 43:1996;1717-1731.
-
(1996)
IEEE Trans. Elec. Dev.
, vol.43
, pp. 1717-1731
-
-
Baliga, B.J.1
-
18
-
-
0027643638
-
Theoretical prediction of the performance of Si and SiC bipolar transistors operating at elevated temperatures
-
Liou J.J., Kager A. Theoretical prediction of the performance of Si and SiC bipolar transistors operating at elevated temperatures. IEE Proc-G, Circuits Devices and Systems. 140:1993;289-293.
-
(1993)
IEE Proc-G, Circuits Devices and Systems
, vol.140
, pp. 289-293
-
-
Liou, J.J.1
Kager, A.2
-
19
-
-
21544461610
-
Large bandgap SiC, III-V nitride and II-VI ZnSe based semiconductor device technologies
-
Morkoç H., et al. Large bandgap SiC, III-V nitride and II-VI ZnSe based semiconductor device technologies. J. App. Phys. 76:1994;1363-1398.
-
(1994)
J. App. Phys.
, vol.76
, pp. 1363-1398
-
-
Morkoç, H.1
-
20
-
-
0000423699
-
Mechanisms limiting current gain in SiC bipolar junction transistors
-
Wang Y., et al. Mechanisms limiting current gain in SiC bipolar junction transistors. Proc. Inst. Phys. Conf. Series. 142:1995;809-812.
-
(1995)
Proc. Inst. Phys. Conf. Series
, vol.142
, pp. 809-812
-
-
Wang, Y.1
-
21
-
-
0030110518
-
A high current and high temperature 6H-SiC thyristor
-
Xie K., et al. A high current and high temperature 6H-SiC thyristor. IEEE Elec. Dev. Lett. 17:1996;142-144.
-
(1996)
IEEE Elec. Dev. Lett.
, vol.17
, pp. 142-144
-
-
Xie, K.1
-
22
-
-
0031269417
-
700 V asymmetrical 4H-SiC gate turn-off thyristors (GTO's)
-
Agarwal A.K., et al. 700 V asymmetrical 4H-SiC gate turn-off thyristors (GTO's). IEEE Elec. Dev. Lett. 18:1997;518-520.
-
(1997)
IEEE Elec. Dev. Lett.
, vol.18
, pp. 518-520
-
-
Agarwal, A.K.1
-
25
-
-
0344670407
-
Determination of static and dynamic performance of SiC power mosfet devices
-
Beydoun B., et al. Determination of static and dynamic performance of SiC power mosfet devices. Proc. EPE. 95:(1):1995;201-206.
-
(1995)
Proc. EPE
, vol.95
, Issue.1
, pp. 201-206
-
-
Beydoun, B.1
-
27
-
-
0031357365
-
The planar 6H-SiC Accufet: A new high voltage power mosfet structure
-
Shenoy P.M., Baliga B.J. The planar 6H-SiC Accufet: a new high voltage power mosfet structure. IEEE Elec. Dev. Lett. 18:1997;589-591.
-
(1997)
IEEE Elec. Dev. Lett.
, vol.18
, pp. 589-591
-
-
Shenoy, P.M.1
Baliga, B.J.2
-
29
-
-
0031362142
-
1.1 kV 4H-SiC power UMOSFETS
-
Agarwal A.K., et al. 1.1 kV 4H-SiC power UMOSFETS. IEEE Elec. Dev. Lett. 18:1997;586-588.
-
(1997)
IEEE Elec. Dev. Lett.
, vol.18
, pp. 586-588
-
-
Agarwal, A.K.1
-
30
-
-
0012885748
-
Design and simulation of a 6H-SiC UMOSFET and IGBT for high temperature power electronics applications
-
Ramungu N., et al. Design and simulation of a 6H-SiC UMOSFET and IGBT for high temperature power electronics applications. Proc. Inst. Phys. Conf. 142:1995;773-776.
-
(1995)
Proc. Inst. Phys. Conf.
, vol.142
, pp. 773-776
-
-
Ramungu, N.1
-
31
-
-
0000917096
-
SiC device technology - Remaining issues
-
Palmour J.W., et al. SiC device technology - remaining issues. Diamond and Related Materials. 6:1997;1400-1404.
-
(1997)
Diamond and Related Materials
, vol.6
, pp. 1400-1404
-
-
Palmour, J.W.1
-
33
-
-
0030083151
-
Avalanche breakdown of high voltage p-n junctions of SiC
-
Pelaz L., et al. Avalanche breakdown of high voltage p-n junctions of SiC. Microelectronics Journal. 27:1996;43-51.
-
(1996)
Microelectronics Journal
, vol.27
, pp. 43-51
-
-
Pelaz, L.1
-
35
-
-
0027149650
-
Edge terminations for SiC high voltage Schottky rectifiers
-
Bhatnagar M., et al. Edge terminations for SiC high voltage Schottky rectifiers. Proc. 5th ISPSD. 5:1993;89-94.
-
(1993)
Proc. 5th ISPSD
, vol.5
, pp. 89-94
-
-
Bhatnagar, M.1
-
36
-
-
0031124795
-
Periphery protection for silicon carbide devices-state of the art and simulation
-
Planson D., et al. Periphery protection for silicon carbide devices-state of the art and simulation. Mat. Sci. and Eng. B. 46:1997;210-217.
-
(1997)
Mat. Sci. and Eng. B
, vol.46
, pp. 210-217
-
-
Planson, D.1
-
37
-
-
0042728259
-
Numerical study of avalanche breakdown of 6H-SiC planar p-n junctions
-
Stefanov E., Bailon L., Barbolla J. Numerical study of avalanche breakdown of 6H-SiC planar p-n junctions. Diamond and Related Materials. 6:1997;1500-1503.
-
(1997)
Diamond and Related Materials
, vol.6
, pp. 1500-1503
-
-
Stefanov, E.1
Bailon, L.2
Barbolla, J.3
|