Effects of hydrogen in the annealing environment on photoluminescence from Si nanoparticles in SiO2

Journal of Applied Physics

Volumn 86, Issue 1, 1999, Pages 396-401

  Withrow, S P ^a   White, C W ^a   Meldrum, A ^a   Budai, J D ^a   Hembree Jr , D M ^b   Barbour, J C ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Y 12 Plant   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION EFFECTS; CRYSTAL DEFECTS; HYDROGEN; INTERFACES (MATERIALS); PHOTOLUMINESCENCE; SILICA; SPECTROSCOPIC ANALYSIS;

RADIATIVE EMISSION MECHANISMS; SPECTRAL DISTRIBUTION;

NANOSTRUCTURED MATERIALS;

EID: 0032614511     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370699     Document Type: Article

References (28)

1. L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).
2. C. W. White et al., Nucl. Instrum. Methods Phys. Res. B 141, 228 (1998); C. W. White, S. P. Withrow, A. Meldrum, J. D. Budai, D. M. Hembree, J. G. Zhu, D. O. Henderson, and S. Prawer, Mater. Res. Soc. Symp. Proc. 507, 249 (1998).
3. C. W. White et al., Nucl. Instrum. Methods Phys. Res. B 141, 228 (1998); C. W. White, S. P. Withrow, A. Meldrum, J. D. Budai, D. M. Hembree, J. G. Zhu, D. O. Henderson, and S. Prawer, Mater. Res. Soc. Symp. Proc. 507, 249 (1998).
4. E. Neufeld, S. Wang, R. Apetz, Ch. Buchal, R. Carius, C. W. White, and D. K. Thomas, Thin Solid Films 294, 238 (1997).
5. K. S. Min, K. V. Shcheglov, C. M. Yang, Harry A. Atwater, M. L. Brongersma, and A. Polman, Appl. Phys. Lett. 69, 2033 (1996).
6. H. A. Atwater, K. V. Shcheglov, S. S. Wong, K. J. Vahala, R. C. Flagan, M. L. Brongersma, and A. Pohlman, Mater. Res. Soc. Symp. Proc. 316, 409 (1994); M. L. Brongersma, A. Polman, K. S. Min, E. Boer, T. Tambo, and H. A. Atwater, Appl. Phys. Lett. 72, 2577 (1998).
7. H. A. Atwater, K. V. Shcheglov, S. S. Wong, K. J. Vahala, R. C. Flagan, M. L. Brongersma, and A. Pohlman, Mater. Res. Soc. Symp. Proc. 316, 409 (1994); M. L. Brongersma, A. Polman, K. S. Min, E. Boer, T. Tambo, and H. A. Atwater, Appl. Phys. Lett. 72, 2577 (1998).
8. T. Shimizu-Iwayama, S. Nakao, K. Saitoh, and N. Itoh, J. Phys.: Condens. Matter 6, L601 (1994); T. Shimizu-Iwayama, N. Kurumado, D. E. Hole, and Peter D. Townsend, J. Appl. Phys. 83, 6018 (1998).
9. T. Shimizu-Iwayama, S. Nakao, K. Saitoh, and N. Itoh, J. Phys.: Condens. Matter 6, L601 (1994); T. Shimizu-Iwayama, N. Kurumado, D. E. Hole, and Peter D. Townsend, J. Appl. Phys. 83, 6018 (1998).
10. T. Shimizu-Iwayama, K. Fujita, S. Nakao, K. Saitoh, T. Fujita, and N. Itoh, J. Appl. Phys. 75, 7779 (1994).
11. P. Mutti, G. Ghislotti, S. Bertoni, L. Bonoldi, G. F. Cerofolini, L. Meda, E. Grilli, and M. Guzzi, Appl. Phys. Lett. 66, 851 (1995).
12. T. Komoda, J. P. Kelly, A. Nejim, K. P. Homewood, P. L. F. Hemment, and B. J. Sealy, Mater. Res. Soc. Symp. Proc. 358, 163 (1995).
13. T. Fischer, V. Petrova-Koch, K. Shcheglov, M. S. Brandt, and F. Koch, Thin Solid Films 276, 100 (1996).
14. L.-S. Liao, X.-M. Bao, X.-Q. Zheng, N.-S. Li, and N.-B. Min, Appl. Phys. Lett. 68, 850 (1996).
15. G. A. Kachurin, K. S. Zhuravlev, N. A. Pazdnikov, A. F. Leier, I. E. Tyschenko, V. A. Volodin, W. Skorupa, and R. A. Yankov, Nucl. Instrum. Methods Phys. Res. B 127/128, 583 (1997).
16. S. Tiwari, F. Rana, H. Hanafi, A. Hartstein, E. F. Crabbé, and K. Chan, Appl. Phys. Lett. 68, 1377 (1996).
17. F. Koch and V. Petrova-Koch, J. Non-Cryst. Solids 198-200, 840 (1996).
18. J. G. Zhu (private communication).
19. G. Revesz, J. Electrochem. Soc. 126, 122 (1979).
20. D. L. Griscom, J. Appl. Phys. 58, 2524 (1985).
21. D. Fink, J. Krauser, D. Nagengast, T. Almeida Murphy, J. Erxmeier, L. Palmetshofer, D. Bräunig, and A. Weidinger, Appl. Phys. A: Mater. Sci. Process. 61, 381 (1995).
22. R. A. B. Devine, J. Appl. Phys. 56, 563 (1984).
23. J. F. Ziegler, "Transport of Ions in Matter" (TRIM 98), IBM Corp. Software, (1998); J. F. Ziegler, J. P. Biersack, and U. Littmark, in The Stopping and Range of Ions in Solids, edited by J. F. Ziegler (Pergamon, New York, 1985), Vol. 1.
24. J. F. Ziegler, "Transport of Ions in Matter" (TRIM 98), IBM Corp. Software, (1998); J. F. Ziegler, J. P. Biersack, and U. Littmark, in The Stopping and Range of Ions in Solids, edited by J. F. Ziegler (Pergamon, New York, 1985), Vol. 1.
25. 2.
26. N. M. Johnson, D. K. Biegelsen, and M. D. Moyer, J. Vac. Sci. Technol. 19, 390 (1981).
27. T. Matsumoto, Y. Masumoto, S. Nakashima, and N. Koshida, Thin Solid Films 297, 31 (1997).
28. L. N. Dinh, L. L. Chase, M. Balooch, W. J. Siekhaus, and F. Wooten, Phys. Rev. B 54, 5029 (1996).