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Thin Solid Films

Volumn 297, Issue 1-2, 1997, Pages 31-34

Luminescence from deuterium-terminated porous silicon

(4) Matsumoto, Takahiro a Masumoto, Yasuaki a Nakashima, Shinichi b Koshida, Nobuyoshi c

a JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

b OSAKA UNIVERSITY (Japan)

c TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY (Japan)

Author keywords

Nanocrystal; Photoluminescence; Porous silicon; Quantum size effects; Surface effect

Indexed keywords

ANODIC OXIDATION; ELECTROCHEMISTRY; ELECTROLYTES; FABRICATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; QUANTUM THEORY; RAMAN SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

DEUTERIUM TERMINATED POROUS SILICON; ELECTROCHEMICAL ANODIZATION; QUANTUM SIZE EFFECTS; SURFACE EFFECT;

POROUS SILICON;

EID: 0031120870 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(96)09537-5 Document Type: Article

Times cited : (14)

References (15)

1
- 0141775174
- L.T. Canham, Appl. Phys. Lett., 57 (1990) 1046.
- (1990) Appl. Phys. Lett. , vol.57 , pp. 1046
- Canham, L.T.¹

2
- 1842595981
- V. Lehmann and U. Gösele, Appl. Phys. Lett., 58 (1991) 856.
- (1991) Appl. Phys. Lett. , vol.58 , pp. 856
- Lehmann, V.¹ Gösele, U.²

3
- 13844320014
- R.P. Vasquez, R.W. Fathauer, T. George, A. Ksendoz and T.L. Lin, Appl. Phys. Lett., 60 (1992) 1004.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 1004
- Vasquez, R.P.¹ Fathauer, R.W.² George, T.³ Ksendoz, A.⁴ Lin, T.L.⁵

4
- 0000683123
- Y. Kanemitsu, H. Uto, Y. Matsumoto, T. Futagi, T. Matsumoto and H. Mimura, Phys. Rev. B, 48 (1993) 2827.
- (1993) Phys. Rev. B , vol.48 , pp. 2827
- Kanemitsu, Y.¹ Uto, H.² Matsumoto, Y.³ Futagi, T.⁴ Matsumoto, T.⁵ Mimura, H.⁶

5
- 33847558022
- C. Tsai, K.H-. Li, J. Sarathy, S. Shih, J.C. Campbell, B.K. Hance and J.M. White, Appl. Phys. Lett., 59 (1991) 2814.
- (1991) Appl. Phys. Lett. , vol.59 , pp. 2814
- Tsai, C.¹ Li, K.H.² Sarathy, J.³ Shih, S.⁴ Campbell, J.C.⁵ Hance, B.K.⁶ White, J.M.⁷

6
- 0000317389
- S.M. Prokes, O.J. Glembocki, V.M. Bermudez, R. Kaplan, L.E. Friedersdorf and P.C. Searson, Phys. Rev. B, 45 (1992) 13 788.
- (1992) Phys. Rev. B , vol.45 , pp. 13788
- Prokes, S.M.¹ Glembocki, O.J.² Bermudez, V.M.³ Kaplan, R.⁴ Friedersdorf, L.E.⁵ Searson, P.C.⁶

7
- 0028442654
- C.J. Karlsson, F. Owman, E. Landemark, Y.-C. Chao, P. Mårtensson and R.I.G. Uhrberg, Phys. Rev. Lett., 72 (1994) 4145.
- (1994) Phys. Rev. Lett. , vol.72 , pp. 4145
- Karlsson, C.J.¹ Owman, F.² Landemark, E.³ Chao, Y.-C.⁴ Mårtensson, P.⁵ Uhrberg, R.I.G.⁶

8
- 30244464975
- unpublished data
- T. Ohno and T. Matsumoto, unpublished data.
- Ohno, T.¹ Matsumoto, T.²

9
- 30244547706
- As is well known, any transverse polarization wave has zero divergence
- As is well known, any transverse polarization wave has zero divergence.

10
- 18544401555
- Self-trapping states will occur by the deformation potential, which is discussed in Y. Toyozawa, Physica B, 117/118 ( 1983) 23.
- (1983) Physica B , vol.117-118 , pp. 23
- Toyozawa, Y.¹

11
- 84931521983
- H. Fröhlich, Adv. Phys., 3 (1954) 325.
- (1954) Adv. Phys. , vol.3 , pp. 325
- Fröhlich, H.¹

12
- 0004428721
- T.D. Lee, F.E. Low and D. Pines, Phys. Rev., 90 (1953) 297.
- (1953) Phys. Rev. , vol.90 , pp. 297
- Lee, T.D.¹ Low, F.E.² Pines, D.³

13
- 0003029576
- T. Uda and M. Hirao, J. Phys. Soc. Jpn., 63 (Suppl. B) (1994) 97.
- (1994) J. Phys. Soc. Jpn. , vol.63 , Issue.SUPPL. B , pp. 97
- Uda, T.¹ Hirao, M.²

14
- 0028407103
- S. Schuppler, S.L. Friedman, M.A. Marcus, D.L. Adler, Y.-H. Xie, F.M. Ross, T.D. Harris, W.L. Brown, Y.J. Chabel, L.E. Brus and P.H. Citrin, Phys. Rev. Lett., 72 (1994) 2648.
- (1994) Phys. Rev. Lett. , vol.72 , pp. 2648
- Schuppler, S.¹ Friedman, S.L.² Marcus, M.A.³ Adler, D.L.⁴ Xie, Y.-H.⁵ Ross, F.M.⁶ Harris, T.D.⁷ Brown, W.L.⁸ Chabel, Y.J.⁹ Brus, L.E.¹⁰ Citrin, P.H.¹¹

15
- 21544478900
- H. Takagi, H. Ogawa, Y. Yamazaki, A. Ishizaki and T. Nakagiri, Appl. Phys. Lett., 56 (1990) 2349.
- (1990) Appl. Phys. Lett. , vol.56 , pp. 2349
- Takagi, H.¹ Ogawa, H.² Yamazaki, Y.³ Ishizaki, A.⁴ Nakagiri, T.⁵

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