-
9
-
-
0030688770
-
Gallium nitride and related materials II
-
Eds. C. R. ABERNATHY, H. AMANO, and J. C. ZOLPER
-
T. YAMAMOTO and H. KATAYAMA-YOSHIDA, Gallium Nitride and Related Materials II, Eds. C. R. ABERNATHY, H. AMANO, and J. C. ZOLPER, Mater. Res. Soc. Proc. 468, 105 (1997).
-
(1997)
Mater. Res. Soc. Proc.
, vol.468
, pp. 105
-
-
Yamamoto, T.1
Katayama-Yoshida, H.2
-
10
-
-
11744257796
-
Proc. 2nd internat. conf. nitride semiconductors
-
Tokushima, to be published
-
T. YAMAMOTO and H. KATAYAMA-YOSHIDA, Proc. 2nd Internat. Conf. Nitride Semiconductors, Tokushima, 1997 (p. 272), to be published in J. Cryst. Growth.
-
(1997)
J. Cryst. Growth
, pp. 272
-
-
Yamamoto, T.1
Katayama-Yoshida, H.2
-
12
-
-
0030260130
-
-
O. BRANDT, H. YANG, H. KOSTIAL, and K. H. PLOOG, Appl. Phys. Lett. 69, 2707 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 2707
-
-
Brandt, O.1
Yang, H.2
Kostial, H.3
Ploog, K.H.4
-
13
-
-
85033886176
-
-
Defect and Impurity Engineered Semiconductors and Devices II, Eds. S. ASHOK, J. CHEVALLIER, K. SUMINO, B. L. SOPORI, and W. GOETZ, to be published
-
T. YAMAMOTO and H. KATAYAMA-YOSHIDA, in: Defect and Impurity Engineered Semiconductors and Devices II, Eds. S. ASHOK, J. CHEVALLIER, K. SUMINO, B. L. SOPORI, and W. GOETZ, Mater. Res. Soc. Proc. 510 (1998), to be published.
-
(1998)
Mater. Res. Soc. Proc.
, vol.510
-
-
Yamamoto, T.1
Katayama-Yoshida, H.2
-
15
-
-
0039263202
-
-
I. LUCK, M. FIEBER-ERDMANN, B. TEICHERT, R. SCHEER, E. HOLUB-KRAPPE, and H.-J. LEWERENZ, Inst. Phys. Conf. Ser. No. 152, 385 (1998).
-
(1998)
Inst. Phys. Conf. Ser. No. 152
, vol.152
, pp. 385
-
-
Luck, I.1
Fieber-Erdmann, M.2
Teichert, B.3
Scheer, R.4
Holub-Krappe, E.5
Lewerenz, H.-J.6
-
16
-
-
0001609423
-
-
H. D. JUNG, C. D. SONG, S. Q. WANG, K. ARAI, Y. H. WU, Z. ZHU, T. YAO, and H. KATAYAMA-YOSHIDA, Appl. Phys. Lett. 70, 1143 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 1143
-
-
Jung, H.D.1
Song, C.D.2
Wang, S.Q.3
Arai, K.4
Wu, Y.H.5
Zhu, Z.6
Yao, T.7
Katayama-Yoshida, H.8
-
19
-
-
0030393906
-
Thin films for photovoltaic and related device applications
-
Eds. D. GINLEY, A. CATALANO, H. W. SHOCK, CH. EBERSPACHER, T. M. PETERSON, and T. WADA
-
T. YAMAMOTO and H. KATAYAMA-YOSHIDA, Thin Films for Photovoltaic and Related Device Applications, Eds. D. GINLEY, A. CATALANO, H. W. SHOCK, CH. EBERSPACHER, T. M. PETERSON, and T. WADA, Mater. Res. Soc. Proc. 426, 201 (1996).
-
(1996)
Mater. Res. Soc. Proc.
, vol.426
, pp. 201
-
-
Yamamoto, T.1
Katayama-Yoshida, H.2
-
26
-
-
0000456470
-
-
S. KOIZUMI, M. KAMO, Y. SATO, H. OZAKI, and T. INIZUKA, Appl. Phys. Lett. 71, 1065 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 1065
-
-
Koizumi, S.1
Kamo, M.2
Sato, Y.3
Ozaki, H.4
Inizuka, T.5
-
27
-
-
85033877696
-
-
ZnSe: JP H8-225818, JP98-53497, EPC 97113248.5-1270, USP 08/908,307
-
ZnSe: JP H8-225818, JP98-53497, EPC 97113248.5-1270, USP 08/908,307.
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-
-
-
28
-
-
85033900294
-
-
GaN: JP H8-258054
-
GaN: JP H8-258054.
-
-
-
-
29
-
-
85033895495
-
-
2: JP H09-011763, H09-121136, JP97-02829, H09-239839
-
2: JP H09-011763, H09-121136, JP97-02829, H09-239839.
-
-
-
-
30
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-
85033889558
-
-
AlN: submitted to JP 1998
-
AlN: submitted to JP 1998.
-
-
-
-
31
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85033893639
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-
Diamond: JP H10-287966, JP H7-188030, USP 08/671,946, EPC 96110397.5
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Diamond: JP H10-287966, JP H7-188030, USP 08/671,946, EPC 96110397.5.
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