-
1
-
-
0001961963
-
-
90, 1992.
-
D. Ventura, A. Gnudi, and G. Baccarani, "Multidimensional spherical harmonics expansion of Boltzmann equation for transport in semiconductors," Appl. Math. Lett., vol. 5, no. 3, pp. 85-90, 1992.
-
A. Gnudi, and G. Baccarani, "Multidimensional Spherical Harmonics Expansion of Boltzmann Equation for Transport in Semiconductors," Appl. Math. Lett., Vol. 5, No. 3, Pp. 85
-
-
Ventura, D.1
-
2
-
-
51249167887
-
-
pp. 1-33, 1995.
-
_, "A deterministic approach to the solution of the BTE in semiconductors," La Rivista del Nuovo Cimenta, vol. 18, no. 6, pp. 1-33, 1995.
-
"A Deterministic Approach to the Solution of the BTE in Semiconductors," La Rivista Del Nuovo Cimenta, Vol. 18, No. 6
-
-
-
3
-
-
0029359452
-
-
8, pp. 1485-1495.
-
K. A. Hennacy, Y. J. Wu, N. Goldsman, and I. D. Meiergoyz, "Deterministic MOSFET simulation using a generalized spherical harmonic expansion of the Boltzmann equation," Solid-State Electron., vol. 38, no. 8, pp. 1485-1495.
-
, Y. J. Wu, N. Goldsman, and I. D. Meiergoyz, "Deterministic MOSFET Simulation Using a Generalized Spherical Harmonic Expansion of the Boltzmann Equation," Solid-State Electron., Vol. 38, No.
-
-
Hennacy, K.A.1
-
4
-
-
84920720048
-
-
28, Editions Frontieres.
-
M. C. Vecchi, A. Greiner, and M. Rudan, "Modeling surface scattering effects in the solution of the BTE based on spherical harmonics expansion," in Proc. ESSDERC'96 Conf., Bologna, Italy, 1996, pp. 825-828, Editions Frontieres.
-
, A. Greiner, and M. Rudan, "Modeling Surface Scattering Effects in the Solution of the BTE Based on Spherical Harmonics Expansion," in Proc. ESSDERC'96 Conf., Bologna, Italy, 1996, Pp. 825-8
-
-
Vecchi, M.C.1
-
5
-
-
0031079523
-
-
eb. 1997.
-
W. Eiang, N. Goldsman, I. Mayergoyz, and P. J. Oldiges, "2-D MOSFET modeling including surface effects and impact ionization by selfconsistent solution of the Boltzmann, Poisson, and hole-continuity equations," IEEE Trans. Electron Devices, vol. 44, p. 257, Feb. 1997.
-
N. Goldsman, I. Mayergoyz, and P. J. Oldiges, "2-D MOSFET Modeling including Surface Effects and Impact Ionization by Selfconsistent Solution of the Boltzmann, Poisson, and Hole-continuity Equations," IEEE Trans. Electron Devices, Vol. 44, P. 257, F
-
-
Eiang, W.1
-
6
-
-
0031647347
-
-
38, Jan. 1998.
-
M. C. Vecchi and M. Rudan, "Modeling electron and hole transport with full-band structure effects by means of the spherical-harmonics expansion of the BTE," IEEE Trans. Electron Devices, vol. 45, pp. 230-238, Jan. 1998.
-
And M. Rudan, "Modeling Electron and Hole Transport with Full-band Structure Effects by means of the Spherical-harmonics Expansion of the BTE," IEEE Trans. Electron Devices, Vol. 45, Pp. 230-2
-
-
Vecchi, M.C.1
-
7
-
-
84983227767
-
-
94, pp. 55-58.
-
M. C. Vecchi, D. Ventura, A. Gnudi, and G. Baccarani, "Incorporating full band-structure effects in the spherical-harmonics expansion of the Boltzmann transport equation," in Proc. NUPAD V Conf., Honolulu, HI, 1994, pp. 55-58.
-
, D. Ventura, A. Gnudi, and G. Baccarani, "Incorporating Full Band-structure Effects in the Spherical-harmonics Expansion of the Boltzmann Transport Equation," in Proc. NUPAD V Conf., Honolulu, HI, 19
-
-
Vecchi, M.C.1
-
8
-
-
36449005145
-
-
25, 1993.
-
E. Cartier, M. V. Fischetti, E. A. Eklund, and F. R. McFeely, "Impact ionization in silicon," Appl. Phys. Lett., vol. 62, no. 25, 1993.
-
M. V. Fischetti, E. A. Eklund, and F. R. McFeely, "Impact Ionization in Silicon," Appl. Phys. Lett., Vol. 62, No.
-
-
Cartier, E.1
-
9
-
-
35949009958
-
-
p. 9721, 1988.
-
M. V. Fischetti and S. E. Eaux, "Monte-Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects," Phys. Rev. B., vol. 38, p. 9721, 1988.
-
And S. E. Eaux, "Monte-Carlo Analysis of Electron Transport in Small Semiconductor Devices including Band-structure and Space-charge Effects," Phys. Rev. B., Vol. 38
-
-
Fischetti, M.V.1
-
10
-
-
0027576244
-
-
pp. 575-581, 1993.
-
A. Gnudi, D. Ventura, G. Baccarani, and F. Odeh, "Two-dimensional MOSFET simulation by means of a multidimensional spherical harmonics expansion of the Boltzmann transport equation," Solid-State Electron., vol. 36, no. 4, pp. 575-581, 1993.
-
D. Ventura, G. Baccarani, and F. Odeh, "Two-dimensional MOSFET Simulation by means of a Multidimensional Spherical Harmonics Expansion of the Boltzmann Transport Equation," Solid-State Electron., Vol. 36, No. 4
-
-
Gnudi, A.1
-
11
-
-
33747039650
-
-
pp. 194-199, 1992.
-
D. Ventura, A. Gnudi, and G. Baccarani, "An efficient method for evaluating the energy distribution of electrons in semiconductors based on the spherical harmonics expansion," IEICE Trans. Electron., vol. 75-C, no. 2, pp. 194-199, 1992.
-
A. Gnudi, and G. Baccarani, "An Efficient Method for Evaluating the Energy Distribution of Electrons in Semiconductors Based on the Spherical Harmonics Expansion," IEICE Trans. Electron., Vol. 75-C, No. 2
-
-
Ventura, D.1
-
12
-
-
0025457187
-
-
pp. 1663, 1990.
-
S. E. Eaux, M. V. Fischetti, and D. J. Franck, "Monte Carlo analysis of semiconductor devices: The DAMOCEES program," IBM J. Res. Develop., vol. 34, pp. 1663, 1990.
-
, M. V. Fischetti, and D. J. Franck, "Monte Carlo Analysis of Semiconductor Devices: the DAMOCEES Program," IBM J. Res. Develop., Vol. 34
-
-
Eaux, S.E.1
-
13
-
-
33747031533
-
-
2, pp. 27-57.
-
M. Rudan, M. Eorenzini, and R. Brunetti, Hydrodynamics Simulation of Semiconductor Devices, vol. 4 of Electronic Materials, 1st ed., E. Scholl, Ed. Eondon, U.K.: Chapman & Hall, 1998, ch. 2, pp. 27-57.
-
M. Eorenzini, and R. Brunetti, Hydrodynamics Simulation of Semiconductor Devices, Vol. 4 of Electronic Materials, 1st Ed., E. Scholl, Ed. Eondon, U.K.: Chapman & Hall, 1998, Ch.
-
-
Rudan, M.1
-
14
-
-
35949025517
-
-
p. 645, 1983.
-
C. Jacoboni and E. Reggiani, "The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials," Rev. Mod. Phys., vol. 55, p. 645, 1983.
-
And E. Reggiani, "The Monte Carlo Method for the Solution of Charge Transport in Semiconductors with Applications to Covalent Materials," Rev. Mod. Phys., Vol. 55
-
-
Jacoboni, C.1
-
15
-
-
0007702208
-
-
p. E861, 1987.
-
E. Scholl and W. Quade, "Effect of impact ionization on hot-carrier energy and momentum relaxation in semiconductors," J. Phys. C, vol. 20, p. E861, 1987.
-
And W. Quade, "Effect of Impact Ionization on Hot-carrier Energy and Momentum Relaxation in Semiconductors," J. Phys. C, Vol. 20
-
-
Scholl, E.1
-
16
-
-
85034187142
-
-
PAD Conf., 1996.
-
M. V. Fischetti, N. Sano, S. E. Eaux, and K. Natori, "Full-band Monte Carlo simulation of high-energy transport and impact ionization of electrons and holes in Ge, Si and GaAs," in Proc. SISPAD Conf., 1996.
-
, N. Sano, S. E. Eaux, and K. Natori, "Full-band Monte Carlo Simulation of High-energy Transport and Impact Ionization of Electrons and Holes in Ge, Si and GaAs," in Proc. SIS
-
-
Fischetti, M.V.1
-
17
-
-
0343130640
-
-
76, Oct. 1995.
-
Y. J. Wu and N. Goldsman, "Deterministic modeling of impact ionization with a random-fc approximation and the multiband Boltzmann equation," J. Appl. Phys., vol. 8, no. 78, pp. 5174-5176, Oct. 1995.
-
"Deterministic Modeling of Impact Ionization with a Random-fc Approximation and the Multiband Boltzmann Equation," J. Appl. Phys., Vol. 8, No. 78, Pp. 5174-51
-
-
Wu, Y.J.1
Goldsman, N.2
-
19
-
-
0006806317
-
-
17, Aug. 1967.
-
E. J. Moore, "Quantum-transport theories and multiple scatterings in doped semiconductors-I. Formal theory," Phys. Rev., vol. 160, no. 3, pp. 607-617, Aug. 1967.
-
, "Quantum-transport Theories and Multiple Scatterings in Doped Semiconductors-I. Formal Theory," Phys. Rev., Vol. 160, No. 3, Pp. 607-6
-
-
Moore, E.J.1
-
20
-
-
0026899612
-
-
pp. 953-959, 1992.
-
D. B. M. Klaassen, "A unified mobility model for device simulation-I. Model equations and concentration dependence," Solid State Electron., vol. 35, no. 7, pp. 953-959, 1992.
-
. Klaassen, "A Unified Mobility Model for Device Simulation-I. Model Equations and Concentration Dependence," Solid State Electron., Vol. 35, No. 7
-
-
-
21
-
-
0024926435
-
-
p. 1663, 1989.
-
R. Brunetti etal., "A many-band silicon model for hot-electron transport at high energies," Solid-State Electron., vol. 32, no. 12, p. 1663, 1989.
-
Etal., "A Many-band Silicon Model for Hot-electron Transport at High Energies," Solid-State Electron., Vol. 32, No. 12
-
-
Brunetti, R.1
-
22
-
-
0000137946
-
-
24, Jan. 1960.
-
R. A. Eogan and A. J. Peters, "Impurity effects upon mobility in silicon," J. Appl. Phys., vol. 31, no. 1, pp. 122-124, Jan. 1960.
-
And A. J. Peters, "Impurity Effects upon Mobility in Silicon," J. Appl. Phys., Vol. 31, No. 1, Pp. 122-1
-
-
Eogan, R.A.1
-
23
-
-
0017453673
-
-
pp. 77-89, 1977.
-
C. Jacoboni, C. Canali, G. Ottaviani, and A. Algerigi Quaranta, "A review of some charge transport properties of silicon," Solid State Electron., vol. 20, pp. 77-89, 1977.
-
C. Canali, G. Ottaviani, and A. Algerigi Quaranta, "A Review of some Charge Transport Properties of Silicon," Solid State Electron., Vol. 20
-
-
Jacoboni, C.1
-
24
-
-
0020087475
-
-
95, Feb. 1982.
-
N. D. Arora, J. R. Hauser, and D. J. Roulston, "Electron and hole mobilities in silicon as a function of concentration an temperature," IEEE Trans. Electron Devices, Vol. ED29, pp. 292-295, Feb. 1982.
-
, J. R. Hauser, and D. J. Roulston, "Electron and Hole Mobilities in Silicon as a Function of Concentration an Temperature," IEEE Trans. Electron Devices, Vol. ED29, Pp. 292-2
-
-
Arora, N.D.1
-
25
-
-
0026899752
-
-
pp. 961-967, 1992.
-
D. B. M. Klaasen, "A unified mobility model for device simulation-II. Temperature dependence of carrier mobility and lifetime," Solid State Electron., vol. 35, no. 7, pp. 961-967, 1992.
-
. Klaasen, "A Unified Mobility Model for Device Simulation-II. Temperature Dependence of Carrier Mobility and Lifetime," Solid State Electron., Vol. 35, No. 7
-
-
-
26
-
-
0017509076
-
-
pp. 609-616, 1977.
-
S. S. Li and W. R. Thurber, "The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon," Solid State Electron., vol. 20, pp. 609-616, 1977.
-
And W. R. Thurber, "The Dopant Density and Temperature Dependence of Electron Mobility and Resistivity in N-type Silicon," Solid State Electron., Vol. 20
-
-
Li, S.S.1
-
27
-
-
0346658116
-
-
35, Oct. 1954.
-
F. J. Morin and J. P. Malta, "Electrical properties of silicon containing arsenic and boron," Phys. Rev., vol. 96, no. 1, pp. 28-35, Oct. 1954.
-
And J. P. Malta, "Electrical Properties of Silicon Containing Arsenic and Boron," Phys. Rev., Vol. 96, No. 1, Pp. 28
-
-
Morin, F.J.1
-
28
-
-
0018008243
-
-
pp. 1109-1117, 1978.
-
S. S. Li, "The dopant density and temperature dependence of hole mobility and resistivity in boron-doped silicon," Solid State Electron., vol. 21, pp. 1109-1117, 1978.
-
, "The Dopant Density and Temperature Dependence of Hole Mobility and Resistivity in Boron-doped Silicon," Solid State Electron., Vol. 21
-
-
Li, S.S.1
-
29
-
-
0024105667
-
-
71, Nov. 1988.
-
C. Lombard!, S. Manzini, A. Saporito, and M. Vanzi, "A physically based model for numerical simulation of nonplanar devices," IEEE Trans. Computer-Aided Design, vol. 7, pp. 1164-1171, Nov. 1988.
-
S. Manzini, A. Saporito, and M. Vanzi, "A Physically Based Model for Numerical Simulation of Nonplanar Devices," IEEE Trans. Computer-Aided Design, Vol. 7, Pp. 1164-11
-
-
Lombard, C.1
|