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Volumn 35, Issue 7, 1992, Pages 961-967
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A unified mobility model for device simulation-II. Temperature dependence of carrier mobility and lifetime
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
COMPUTER SIMULATION;
ELECTRON SCATTERING;
SEMICONDUCTOR DEVICE MODELS;
CARRIER LIFETIME;
ELECTRON-HOLE SCATTERING;
MAJORITY/MINORITY CARRIER MOBILITY;
MINORITY CARRIER DIFFUSION LENGTH;
UNIFIED MOBILITY MODEL;
SEMICONDUCTOR DEVICES;
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EID: 0026899752
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/0038-1101(92)90326-8 Document Type: Article |
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Times cited : (403)
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References (26)
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