Compact LDD nMOSFET degradation model

IEEE Transactions on Electron Devices

Volumn 45, Issue 7, 1998, Pages 1538-1547

  Liu, Shau Shen ^a   Jang, Sheng Lyang ^a   Chyau, Chwan Gwo ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Energy balance equation; Hot carrier induced interface state; LDD MOSFET

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FIELDS; HOT CARRIERS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MODELS; PHYSICS;

ENERGY BALANCE EQUATION;

MOSFET DEVICES;

EID: 0032124256     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.701486     Document Type: Article

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