Hot-Electron-Induced MOSFET Degradation—Model, Monitor, and Improvement

IEEE Transactions on Electron Devices

Volumn 32, Issue 2, 1985, Pages 375-385

  Hu, Chenming ^a   Tam, Simon C ^a   Hsu, Fu Chieh ^a   Ko, Ping Keung ^a   Chan, Tung Yi ^a   Terrill, Kyle W ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84945713471     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1985.21952     Document Type: Article

References (48)

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