Measurement of the switching speed of single FET's

IEEE Transactions on Electron Devices

Volumn 45, Issue 6, 1998, Pages 1369-1373

  Jenkins, Keith A ^a   Burghartz, Joachim N ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Device delay; Large signal; Measurement; Propagation delay; Signal delay; Switching speed; Time domain

Indexed keywords

DIGITAL SIGNAL PROCESSING; GATES (TRANSISTOR); MICROELECTRONICS; SWITCHING CIRCUITS; TIME DOMAIN ANALYSIS;

FULL LOGIC SWINGS;

MOSFET DEVICES;

EID: 0032095762     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.678581     Document Type: Article

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