Calibration methods for time domain network analysis

IEEE Transactions on Microwave Theory and Techniques

Volumn 41, Issue 3, 1993, Pages 415-420

  Hayden, Leonard A ^a   Tripathi, Vijai K ^a  

^a OREGON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CALIBRATION; ELECTRIC NETWORK ANALYZERS; ELECTRIC VARIABLES MEASUREMENT; ERROR CORRECTION; FREQUENCY DOMAIN ANALYSIS; REDUNDANCY; TIME DOMAIN ANALYSIS;

TIME DOMAIN NETWORK ANALYSIS; TIME DOMAIN REFLECTION/TRANSMISSION (TDR/T) MEASUREMENTS;

ELECTRIC NETWORK ANALYSIS;

EID: 0027555756     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.223739     Document Type: Article

References (16)

1. W. M. Scott and G. S. Smith, “Error corrections for an automated time-domain network analyzer,” IEEE Trans. Intrum. Meas., vol. IM-35, no. 3, pp. 300–303, Sept. 1986.
2. G. F. Engen and C. A. Hoer, “Thru-reflect-line: An improved technique for calibrating the dual six port automatic network analyzer,” IEEE Trans. Microwave Theory Tech., vol. MTT-27, pp. 987–993, Dec. 1979.
3. A. M. Nicolson, “Broad-band microwave transmission characteristics from a single measurement of the transient response,” IEEE Trans. Instrum. Meas., vol. IM-17, no. 4, pp. 395–402, Dec. 1968.
4. H. M. Cronson and P. G. Mitchell, “Time-domain measurements of microwave components,” IEEE Trans. Instrum. Meas., vol. IM-22, no. 4, pp. 320–325, Dec. 1973.
5. P. R. Rigg and J. E. Carroll, “Low-cost computer-based time-domain microwave network analyser,” Proc. Inst. Elec. Eng., vol. 127, pt. H, no. 2, pp. 107–111, Apr. 1980.
6. H. W. Loeb and P. J. Ward, “The use of time-domain techniques for microwave transistor S-parameter measurements,” IEEE Trans. Instrum. Meas., vol. IM-26, no. 4, pp. 383–388, Dec. 1977.
7. N. S. Nahman et al., “Applications of time-domain methods to microwave measurements,” Proc. Inst. Elec. Eng., vol. 127, pt. H, no. 2, pp. 99–106, Apr. 1980.
8. J. R. Andrews, “Automatic network measurements in the time domain,” IEEE Proc., vol. 66, no. 4, pp. 414–423, Apr. 1978.
9. Z. Y. Shen, “New time domain reflectometry techniques suitable for testing microwave and millimeter wave circuits,” in Proc. 1990 IEEE MTT Symp., Dallas, pp. 1045–1048.
10. C. A. Hoer and G. F. Engen, “Calibrating a Dual Six-Port or Four-Port for Measuring Two-Ports with any Connectors,” in Proc. 1986 IEEE MTT-S Symp., Baltimore, pp. 665–668.
11. H. J. Eul and B. Schiek, “A generalized theory and new calibration procedures for network analyzer self-calibration,” IEEE Trans. Microwave Theory Tech., vol. 39, pp. 724-731, Apr. 1991.
12. R. A. Speciale, “A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering-parameter measurements, affected by leakage errors,” IEEE Trans. Microwave Theory Tech., vol. MTT-25, pp. 1100–1115, Dec. 1977.
13. R. Y. Yu et al., “A 2.3ps time-domain reflectometer for millimeterwave network analysis,” IEEE Microwave Guided Wave Lett., vol. 1, pp. 334–336, Nov. 1991.
14. A. M. Shaarawi and S. M. Riad, “Computing the complete FFT of a step-like waveform,” IEEE Trans. Instrum. Meas., vol. IM-35, no. 1, pp. 91–92, Mar. 1986.
15. P. Ferrari et al., “A complete calibration procedure for time domain network analyzers,” in Proc. 1992 IEEE MTT-S Symp., Albuquerque, pp. 1451–1454.
16. L. A. Hayden and V. K. Tripathi, “Measurement and characterization of high-speed interconnections using time domain network analysis,” in Proc. 1992 ISHM Intl. Microelectronics Symp., San Francisco.