Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling

IEEE Transactions on Electron Devices

Volumn 45, Issue 5, 1998, Pages 1017-1025

  Raskin, Jean Pierre ^a   Gillon, Renaud ^a   Jian Chen, Danielle Vanhoenacker Janvier ^a   Colinge, Jean Pierre ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

Integrated circuit measurements; Microwave measurements; MOSFET's; Scattering parameters measurements; Silicon on insulator technology

Indexed keywords

CALIBRATION; MICROWAVE MEASUREMENT; OPTIMIZATION; SEMICONDUCTOR DEVICE MODELS; SILICON ON INSULATOR TECHNOLOGY;

INTEGRATED CIRCUIT MEASUREMENT; SCATTERING PARAMETERS MEASUREMENT;

MOSFET DEVICES;

EID: 0032069642     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.669514     Document Type: Article

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