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Volumn 27, Issue 12, 1979, Pages 987-993

Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE MEASUREMENTS;

EID: 0018720739     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/TMTT.1979.1129778     Document Type: Article
Times cited : (1224)

References (13)
  • 1
    • 0002321766 scopus 로고
    • An automatic network analyzer system
    • May
    • R. A. Hackborn, “An automatic network analyzer system,” Microwave J., vol. 11., pp. 45–52, May 1968.
    • (1968) Microwave J. , vol.11 , pp. 45-52
    • Hackborn, R.A.1
  • 2
    • 0002830477 scopus 로고
    • A new procedure for system calibration and error removal in automated S-parameter measurements
    • Hamburg, Germany, Sevenoaks, Kent:England: Microwave Exhibitions and Publishers Sept.
    • N. R. Franzen and R. A. Speciale, “A new procedure for system calibration and error removal in automated S-parameter measurements,” in Proc. 5th European Microwave Goof. (Hamburg, Germany, Sept. 1–4, 1975). Sevenoaks, Kent; England: Microwave Exhibitions and Publishers, pp. 69–73.
    • (1975) Proc. 5th European Microwave Goof. ( , pp. 1-4
    • Franzen, N.R.1    Speciale, R.A.2
  • 3
    • 84938010984 scopus 로고
    • Accurate scattering parameter measurements on nonconnectable microwave networks
    • Rome, Italy. Sevenoaks, Kent, England. Microwave Exhibitions and Publishers Sept. 14–17
    • N. R. Franzen and R. A. Speciale, “Accurate scattering parameter measurements on nonconnectable microwave networks,” in Proc. 6th European Microwave Conf. (Rome, Italy, Sept. 14–17, 1976.) Sevenoaks, Kent, England: Microwave Exhibitions and Publishers, pp. 210–214.
    • (1976) Proc. 6th European Microwave Conf , pp. 210-214
    • Franzen, N.R.1    Speciale, R.A.2
  • 4
    • 0017747922 scopus 로고
    • The six-port reflectometer: An alternative network analyzer
    • Dec.
    • G. F. Engen, “The six-port reflectometer: An alternative network analyzer,” IEEE Trans. Microwave Theory Tech., vol. MTT-25, pp. 1075–1080, Dec. 1977.
    • (1977) IEEE Trans. Microwave Theory Tech. , vol.MTT-25 , pp. 1075-1080
    • Engen, G.F.1
  • 5
    • 0015741716 scopus 로고
    • Calibration of an arbitrary six-port junction for measurement of active and passive circuit parameters
    • Dec.
    • “Calibration of an arbitrary six-port junction for measurement of active and passive circuit parameters,” IEEE Trans. Instrum. Meas., vol. 1M-22, pp. 295–299, Dec. 1973.
    • (1973) IEEE Trans. Instrum. Meas. , vol.1M-22 , pp. 295-299
  • 6
    • 0018055039 scopus 로고
    • Calibrating the six-port reflectometer by means of sliding terminations
    • Dec.
    • “Calibrating the six-port reflectometer by means of sliding terminations,” IEEE Trans. Microwave Theory Tech., vol. MITT-26, pp. 951–957, Dec. 1978.
    • (1978) IEEE Trans. Microwave Theory Tech. , vol.MITT-26 , pp. 951-957
  • 7
    • 84939042584 scopus 로고
    • The application of 'Thru-Short-Delay’ to the calibration of the dual six-port
    • G. F. Engen, C. A. Hoer, and R. A. Speciale, “The application of ‘Thru-Short-Delay’ to the calibration of the dual six-port,” in 1978 IEEE MTT-S ha. Symp. Dig., pp. 184–185.
    • (1978) 1978 IEEE MTT-S ha. Symp. Dig. , pp. 184-185
    • Engen, G.F.1    Hoer, C.A.2    Speciale, R.A.3
  • 8
    • 0017921830 scopus 로고
    • A new technique for calibrating dual six-port networks with application to S-parameter measurement
    • L. Susman, “A new technique for calibrating dual six-port networks with application to S-parameter measurement,” in 1978 IEEE MTT-S Int. Symp. Dig., pp. 179–181.
    • (1978) 1978 IEEE MTT-S Int. Symp. Dig. , pp. 179-181
    • Susman, L.1
  • 9
    • 0017910141 scopus 로고
    • Calibrating two six-port reflectometers with an unknown known length of precision transmission line
    • C. A. Hoer, “Calibrating two six-port reflectometers with an unknown known length of precision transmission line,” in 1978 IEEE MTT-S Int. Symp. Dig., pp. 176–178.
    • (1978) 1978 IEEE MTT-S Int. Symp. Dig. , pp. 176-178
    • Hoer, C.A.1
  • 10
    • 0017678195 scopus 로고
    • A network analyzer incorporating two six-port reflectometers
    • Dec.
    • “A network analyzer incorporating two six-port reflectometers,” IEEE Trans. Microwave Theory Tech., vol. MIT-25, pp. 1070–1075, Dec. 1977.
    • (1977) IEEE Trans. Microwave Theory Tech. , vol.MIT-25 , pp. 1070-1075
  • 11
    • 0016927065 scopus 로고
    • The calibration and use of directional couplers without standards
    • Mar.
    • C. M. Allred and C. H. Manney, “The calibration and use of directional couplers without standards,” IEEE Trans. Instrum. Meas., vol. 1M-25, pp. 84–89, Mar. 1976.
    • (1976) IEEE Trans. Instrum. Meas. , vol.1M-25 , pp. 84-89
    • Allred, C.M.1    Manney, C.H.2
  • 12
    • 0018716211 scopus 로고    scopus 로고
    • Performance of a dual six-port automatic network analyzer
    • C. A. Hoer, “Performance of a dual six-port automatic network analyzer,” this issue, pp. 993–998.
    • this issue , pp. 993-998
    • Hoer, C.A.1
  • 13
    • 0017747923 scopus 로고
    • A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering parameter measurements, affected by leakage errors
    • Dec.
    • R. A. Speciale, “A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering parameter measurements, affected by leakage errors,” IEEE Trans. Microwave Theory Tech., vol. MIT-25, pp. 1100–1115, Dec. 1977.
    • (1977) IEEE Trans. Microwave Theory Tech. , vol.MIT-25 , pp. 1100-1115
    • Speciale, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.