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1
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0002321766
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An automatic network analyzer system
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May
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R. A. Hackborn, “An automatic network analyzer system,” Microwave J., vol. 11., pp. 45–52, May 1968.
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(1968)
Microwave J.
, vol.11
, pp. 45-52
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Hackborn, R.A.1
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2
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0002830477
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A new procedure for system calibration and error removal in automated S-parameter measurements
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Hamburg, Germany, Sevenoaks, Kent:England: Microwave Exhibitions and Publishers Sept.
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N. R. Franzen and R. A. Speciale, “A new procedure for system calibration and error removal in automated S-parameter measurements,” in Proc. 5th European Microwave Goof. (Hamburg, Germany, Sept. 1–4, 1975). Sevenoaks, Kent; England: Microwave Exhibitions and Publishers, pp. 69–73.
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(1975)
Proc. 5th European Microwave Goof. (
, pp. 1-4
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Franzen, N.R.1
Speciale, R.A.2
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3
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84938010984
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Accurate scattering parameter measurements on nonconnectable microwave networks
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Rome, Italy. Sevenoaks, Kent, England. Microwave Exhibitions and Publishers Sept. 14–17
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N. R. Franzen and R. A. Speciale, “Accurate scattering parameter measurements on nonconnectable microwave networks,” in Proc. 6th European Microwave Conf. (Rome, Italy, Sept. 14–17, 1976.) Sevenoaks, Kent, England: Microwave Exhibitions and Publishers, pp. 210–214.
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(1976)
Proc. 6th European Microwave Conf
, pp. 210-214
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Franzen, N.R.1
Speciale, R.A.2
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4
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0017747922
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The six-port reflectometer: An alternative network analyzer
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Dec.
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G. F. Engen, “The six-port reflectometer: An alternative network analyzer,” IEEE Trans. Microwave Theory Tech., vol. MTT-25, pp. 1075–1080, Dec. 1977.
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(1977)
IEEE Trans. Microwave Theory Tech.
, vol.MTT-25
, pp. 1075-1080
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Engen, G.F.1
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5
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0015741716
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Calibration of an arbitrary six-port junction for measurement of active and passive circuit parameters
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Dec.
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“Calibration of an arbitrary six-port junction for measurement of active and passive circuit parameters,” IEEE Trans. Instrum. Meas., vol. 1M-22, pp. 295–299, Dec. 1973.
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(1973)
IEEE Trans. Instrum. Meas.
, vol.1M-22
, pp. 295-299
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6
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0018055039
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Calibrating the six-port reflectometer by means of sliding terminations
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Dec.
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“Calibrating the six-port reflectometer by means of sliding terminations,” IEEE Trans. Microwave Theory Tech., vol. MITT-26, pp. 951–957, Dec. 1978.
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(1978)
IEEE Trans. Microwave Theory Tech.
, vol.MITT-26
, pp. 951-957
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7
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84939042584
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The application of 'Thru-Short-Delay’ to the calibration of the dual six-port
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G. F. Engen, C. A. Hoer, and R. A. Speciale, “The application of ‘Thru-Short-Delay’ to the calibration of the dual six-port,” in 1978 IEEE MTT-S ha. Symp. Dig., pp. 184–185.
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(1978)
1978 IEEE MTT-S ha. Symp. Dig.
, pp. 184-185
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Engen, G.F.1
Hoer, C.A.2
Speciale, R.A.3
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8
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0017921830
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A new technique for calibrating dual six-port networks with application to S-parameter measurement
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L. Susman, “A new technique for calibrating dual six-port networks with application to S-parameter measurement,” in 1978 IEEE MTT-S Int. Symp. Dig., pp. 179–181.
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(1978)
1978 IEEE MTT-S Int. Symp. Dig.
, pp. 179-181
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Susman, L.1
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9
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0017910141
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Calibrating two six-port reflectometers with an unknown known length of precision transmission line
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C. A. Hoer, “Calibrating two six-port reflectometers with an unknown known length of precision transmission line,” in 1978 IEEE MTT-S Int. Symp. Dig., pp. 176–178.
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(1978)
1978 IEEE MTT-S Int. Symp. Dig.
, pp. 176-178
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Hoer, C.A.1
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10
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0017678195
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A network analyzer incorporating two six-port reflectometers
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Dec.
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“A network analyzer incorporating two six-port reflectometers,” IEEE Trans. Microwave Theory Tech., vol. MIT-25, pp. 1070–1075, Dec. 1977.
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(1977)
IEEE Trans. Microwave Theory Tech.
, vol.MIT-25
, pp. 1070-1075
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11
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0016927065
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The calibration and use of directional couplers without standards
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Mar.
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C. M. Allred and C. H. Manney, “The calibration and use of directional couplers without standards,” IEEE Trans. Instrum. Meas., vol. 1M-25, pp. 84–89, Mar. 1976.
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(1976)
IEEE Trans. Instrum. Meas.
, vol.1M-25
, pp. 84-89
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Allred, C.M.1
Manney, C.H.2
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12
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0018716211
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Performance of a dual six-port automatic network analyzer
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C. A. Hoer, “Performance of a dual six-port automatic network analyzer,” this issue, pp. 993–998.
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this issue
, pp. 993-998
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Hoer, C.A.1
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13
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0017747923
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A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering parameter measurements, affected by leakage errors
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Dec.
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R. A. Speciale, “A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering parameter measurements, affected by leakage errors,” IEEE Trans. Microwave Theory Tech., vol. MIT-25, pp. 1100–1115, Dec. 1977.
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(1977)
IEEE Trans. Microwave Theory Tech.
, vol.MIT-25
, pp. 1100-1115
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Speciale, R.A.1
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