0.15-μm RF CMOS technology compatible with logic CMOS for low-voltage operation

IEEE Transactions on Electron Devices

Volumn 45, Issue 3, 1998, Pages 737-742

  Saito, Masanobu ^a   Ono, Mizuki ^a   Fujimoto, Ryuichi ^a   Tanimoto, Hiroshi ^a   Ito, Nobuyuki ^a   Yoshitomi, Takashi ^a   Ohguro, Tatsuya ^a   Momose, Hisayo Sasaki ^a   Iwai, Hiroshi ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

Cutoff frequency; Low voltage; Minimum noise figure; MOSFET; Radio frequency

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE; LSI CIRCUITS; MOSFET DEVICES; NATURAL FREQUENCIES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES;

CUTOFF FREQUENCY; NOISE FIGURE;

CMOS INTEGRATED CIRCUITS;

EID: 0032027787     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.661236     Document Type: Article

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