Assessment of the state-of-the-art 0.5 μm bulk CMOS technology for RF applications

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1995, Pages 721-724

  Voinigescu, S P ^a   Tarasewicz, S W ^a   MacElwee, T ^a   Ilowski, J ^a  

^a NORTEL NETWORKS   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BIPOLAR TRANSISTORS; ELECTRIC NETWORK ANALYZERS; GEOMETRY; MESFET DEVICES; MOSFET DEVICES; OPTIMIZATION; PROBES; SEMICONDUCTING GALLIUM ARSENIDE; SILICON ON INSULATOR TECHNOLOGY;

CHANNEL RESISTANCE; GATE RESISTANCE; MAXIMUM OSCILLATION FREQUENCY; ON WAFER COPLANAR PROBES; S PARAMETER MEASUREMENT; SOURCE RESISTANCE;

CMOS INTEGRATED CIRCUITS;

EID: 0029545625     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)