Elastic and plastic relaxation in slightly undulated misfitting epitaxial layers -A quantitative approach by three-dimensional finite element calculations

Physica Status Solidi (A) Applied Research

Volumn 156, Issue 1, 1996, Pages 129-150

  Christiansen, S ^a   Albrecht, M ^a   Michler, J ^a   Strunk, H P ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATIONS; ELASTICITY; EPITAXIAL GROWTH; FINITE ELEMENT METHOD; LATTICE CONSTANTS; MATHEMATICAL MODELS; PLASTICITY; RELAXATION PROCESSES; SUBSTRATES; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY;

COMPRESSIONAL STRAIN; ELASTIC RELAXATION; EPITAXIAL LAYERS; LATTICE DISTORTION; PLASTIC RELAXATION; SURFACE UNDULATIONS;

THIN FILMS;

EID: 0030190770     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.2211560117     Document Type: Article

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