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Ferroelectrics

Volumn 184, Issue 1-4, 1996, Pages 11-20

Scanning force microscopy as a tool for nanoscale study of ferroelectric domains

(4) Gruverman, Alexei a,d Auciello, Orlando b Hatano, Jun c Tokumoto, Hiroshi a

a NATL INST FOR ADV INTERDISC RES (Japan)

b MCNC (United States)

c TOKYO UNIVERSITY OF SCIENCE (Japan)

d URAL FEDERAL UNIVERSITY (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; IMAGING TECHNIQUES; LEAD COMPOUNDS; LITHIUM COMPOUNDS; MICROSCOPIC EXAMINATION; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY; SINGLE CRYSTALS; SURFACE STRUCTURE; THIN FILMS; VISUALIZATION;

FERROELECTRIC DOMAINS; LEAD TITANATE; LEAD ZIRCONATE TITANATE; LITHIUM NIOBATE; PIEZOELECTRIC VIBRATION; SCANNING FORCE MICROSCOPY;

FERROELECTRIC MATERIALS;

EID: 0030357705 PISSN: 00150193 EISSN: None Source Type: Journal
DOI: 10.1080/00150199608230240 Document Type: Article

Times cited : (42)

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