See Results Using High Energy Ions

IEEE Transactions on Nuclear Science

Volumn 42, Issue 6, 1995, Pages 1797-1802

  Duzellier, S ^a   Falguere D ^b   Mouliere L ^b   Ecoffet, R ^c   Buisson, J ^d  

^a ONERA   (France)

^b CNES ^*

^c CNES   (France)

^d NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; IONS; MATHEMATICAL MODELS; RADIATION EFFECTS; SENSITIVITY ANALYSIS;

DYNAMIC RANDOM ACCESS MEMORY (DRAM); HIGH ENERGY IONS; LINEAR ENERGY TRANSFER (LET); STATIC RANDOM ACCESS MEMORY (SRAM);

RANDOM ACCESS STORAGE;

EID: 0029536512     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.488781     Document Type: Article

References (11)

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