Dynamic life-estimation of CMOS ICs in real operating environment: precise electrical method and MLE

IEEE Transactions on Reliability

Volumn 46, Issue 1, 1997, Pages 31-37

  Son, Kyung Im ^a   Soma, Mani ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Circuit maintenance; Failure mechanism; Hot carrier effect; Lifetime distribution; Maximum likelihood estimator; Optimal replacement; Random operating environment; Reliability analysis

Indexed keywords

AGING OF MATERIALS; COMPUTER SIMULATION; FAILURE ANALYSIS; HOT CARRIERS; INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICE MODELS; SERVICE LIFE; STATISTICAL METHODS;

MAXIMUM LIKELIHOOD ESTIMATION (MLE);

CMOS INTEGRATED CIRCUITS;

EID: 0031096490     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.589923     Document Type: Article

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