MEASUREMENTS OF QUIESCENT POWER SUPPLY CURRENT FOR CMOS ICS IN PRODUCTION TESTING.

Digest of Papers - International Test Conference

Volumn , Issue , 1987, Pages 300-309

  Horning, Luther K ^a   Soden, Jerry M ^a   Fritzemeier, Ron R ^a   Hawkins, Charles F ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERS, MICROCOMPUTER - COMPONENTS; INTEGRATED CIRCUITS - ELECTRIC POWER SUPPLIES; SEMICONDUCTOR DEVICES, MOS - TESTING;

COMPLEMENTARY MOS (CMOS); PRODUCTION TESTING; QUIESCENT POWER SUPPLY CURRENT (IDDQ);

ELECTRIC MEASUREMENTS;

EID: 0023601212     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)