Hot-electron-induced input offset voltage degradation in CMOS differential amplifiers

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1992, Pages 76-80

  Mohamedi, Shaheen Z ^a   Chan, Vei Han ^a   Park, Jong Tae ^a   Nouri, Faran ^a   Scharf, Brad W ^a   Chung, James E ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CMOS INTEGRATED CIRCUITS; HOT CARRIERS; RELIABILITY;

HOT ELECTRONS; NMOS TRANSISTORS; PMOS TRANSISTORS;

DIFFERENTIAL AMPLIFIERS;

EID: 0026836471     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1992.363276     Document Type: Conference Paper

References (15)