Hot-carrier degradation of CMOS-inverters

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1988, Pages 208-211

  Weber, W ^a   Risch, L ^a   Krautschneider, W ^a   Wang, Q ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

OSCILLATORS; SEMICONDUCTOR DEVICES, MOS; SEMICONDUCTOR MATERIALS--CHARGE CARRIERS;

CMOS INVERTERS; GATE DELAY TIMES; HOT CARRIER DEGRADATION; RING OSCILLATORS; TRAPPING STAGES;

ELECTRIC INVERTERS;

EID: 0024174385     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)