Memory fault diagnosis by syndrome compression

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2001, Pages 97-101

  Li, Jin Fu ^a   Wu, Cheng Wen ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AREA OVERHEAD; BUILT-IN SELF-DIAGNOSIS; COMPRESSION TECHNIQUES; CONTENT-ADDRESSABLE MEMORY; DATA COMPRESSION TECHNIQUES; DIAGNOSTIC TESTS; EMBEDDED RAMS; STORAGE CAPACITY;

EXHIBITIONS; STATIC RANDOM ACCESS STORAGE;

DATA COMPRESSION;

EID: 0007786003     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2001.915007     Document Type: Conference Paper

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