Hardware compression speeds on Bitmap fail display

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 89-93

  Brown, Ben ^a   Donaldson, John ^a   Gage, Bob ^a   Joffe, Alexander ^a  

^a TERADYNE INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER HARDWARE; DATA COMPRESSION; MICROPROCESSOR CHIPS;

BITMAP DISPLAY PROCESSORS; BITMAP FAIL DISPLAYS;

INTEGRATED CIRCUIT TESTING;

EID: 0031361927     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)