Intrinsic response extraction for the removal of the parasitic effects in analog test buses

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 4, 2000, Pages 437-445

  Su, Chauchin ^a   Chen, Yue Tsang ^a  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004962482     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.838993     Document Type: Article

References (23)

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