Proposal to simplify development of a mixed signal test standard

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 400-409

  Whetsel, Lee ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MULTIPLEXING; STANDARDS;

MIXED SIGNAL TEST STANDARDS;

INTEGRATED CIRCUIT TESTING;

EID: 0030419315     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)