Limited access testing: IEEE 1149.4. Instrumentation and methods

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 388-395

  McDermid, John ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; DIGITAL INSTRUMENTS; ELECTRIC CURRENT MEASUREMENT; ELECTRONICS PACKAGING; FAILURE ANALYSIS; MATHEMATICAL MODELS; STANDARDS; VOLTAGE MEASUREMENT;

DIGITAL TESTING; LIMITED ACCESS TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0032320507     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)