Parasitic effect removal for analog measurement in P1149.4 environment

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 499-508

  Su, Chauchin ^a   Chen, Yue Tsang ^a   Jou, Shyh Jye ^a  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BANDWIDTH; COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRIC DISTORTION; ELECTRIC VARIABLES MEASUREMENT; INTEGRATED CIRCUIT LAYOUT; STANDARDS;

PARASITIC EFFECT REMOVAL; SOFTWARE PACKAGE SPICE;

INTEGRATED CIRCUIT TESTING;

EID: 0031381190     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)