Integration of boundary-scan test methods to a mixed-signal environment

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 159-162

  Ley, Adam W ^a  

^a ASSET INTERTECH INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT; PRINTED CIRCUIT BOARDS; SIGNAL THEORY; STANDARDS;

BOUNDARY SCAN TEST; FINITE STATE MACHINE; MIXED SIGNAL TEST; TEST ACCESS PORT;

PRINTED CIRCUIT TESTING;

EID: 0033316675     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)