Structure and metrology for an analog testability bus

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 309-322

  Parker, Kenneth P ^a   McDermid, John E ^a   Oresjo, Stig ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; ELECTRIC NETWORK TOPOLOGY; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; MEASUREMENTS; NETWORK COMPONENTS; SHORT CIRCUIT CURRENTS; STANDARDS;

ANALOG TESTABILITY BUS; DISCRETE ANALOG COMPONENTS; IEEE 1149.1 STANDARD; INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS (IEEE); TESTABILITY STRUCTURE;

INTEGRATED CIRCUIT TESTING;

EID: 0027801442     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)