Towards a test standard for board and system level mixed-signal interconnects

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 300-308

  Thatcher, Carl W ^a   Tulloss, Rodham E ^a  

^a Test Engineering Dep ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONNECTORS; ELECTRIC FAULT LOCATION; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK PARAMETERS; ELECTRIC WIRING; STANDARDS;

BOARD LEVEL MIXED SIGNAL INTERCONNECTS; DESIGN FOR TESTABILITY (DFT); IEEE 1149.1 STANDARD; INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS (IEEE); SYSTEM LEVEL MIXED SIGNAL INTERCONNECTS;

ELECTRONIC EQUIPMENT TESTING;

EID: 0027833209     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)