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Volumn 70, Issue 9, 1999, Pages 3614-3619

Fast low-cost phase detection setup for tapping-mode atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0004922043     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149968     Document Type: Article
Times cited : (24)

References (31)
  • 9
    • 0032502885 scopus 로고    scopus 로고
    • M. Liley et al., Science 280, 273 (1998).
    • (1998) Science , vol.280 , pp. 273
    • Liley, M.1
  • 22
    • 85034135383 scopus 로고    scopus 로고
    • note
    • Due to hydrodynamic or geometric effects a distance dependence of cantilever motion might be obtained allowing imaging even though the lever is not excited at its own resonance frequency. But in such a case the phase shift might be governed by relations other than those in the case described.
  • 28
    • 85034127707 scopus 로고    scopus 로고
    • note
    • Sample preparation: After plasma cleaning a thermally oxidized silicon wafer a droplet of a NaCl solution (5%) was put on the hydrophilic surface. It was dried with a nitrogen stream, leaving salt crystals around 1 μm in size. The silicon wafer was then briefly exposed to gaseous dimethyldichlorosilane (DMS), and heated in an oven at 100°C for several hours. After thoroughly rinsing the sample, a flat surface only showing hydrophobic and hydrophilic patches is obtained.
  • 30
    • 85034135175 scopus 로고    scopus 로고
    • note
    • Sample preparation: Purple membrane in tris buffer (10 mM tris, 300 mM KCl pH 7.8, in ultrapure water) was allowed to adsorb on mica for 10 min under ambient conditions. Then the sample was thoroughly rinsed with the buffer.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.