Effect of the bimodal size distribution on the optical properties of self-assembled Ge/Si(001) quantum dots

Thin Solid Films

Volumn 380, Issue 1-2, 2000, Pages 78-81

  Yam, V ^a   Le Thanh, Vinh ^a   Compagnon, U ^a   Gennser, U ^a   Boucaud, P ^a   Debarre D ^a   Bouchier, D ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MODAL ANALYSIS; NUCLEATION; PHOTOLUMINESCENCE; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR QUANTUM DOTS;

BIMODAL SIZE DISTRIBUTIONS; PHOTOLUMINESCENCE SPECTROSCOPY; SELF-ASSEMBLED QUANTUM DOTS;

SEMICONDUCTING FILMS;

EID: 0034497761     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01527-3     Document Type: Article

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