Instrumental aspects of x-ray microbeams in the range above 1 keV

Review of Scientific Instruments

Volumn 70, Issue 4, 1999, Pages 1907-1920

  Dhez, P ^a   Chevallier, P ^b   Lucatorto, T B ^c   Tarrio, C ^c  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b SORBONNE UNIVERSITÉ   (France)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001461196     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149733     Document Type: Review

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