Long trace profile measurements on cylindrical aspheres

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 966, Issue , 1989, Pages 354-364

  Takacs, Peter Z ^a   Feng, Su Chen K ^a   Church, Eugene L ^b   Qian, Shi Nan ^c   Liu, Wu Ming ^d  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b US Army ARDEC   (United States)

^c UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^d INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAMS; OPTICAL SYSTEMS; SYNCHROTRON RADIATION;

BROOKHAVEN NATIONAL LABORATORY; CYLINDRICAL MIRROR; ELECTROLESS NICKEL; NON-CONTACT MEASUREMENT TECHNIQUE; OPTICAL COMPONENTS; PENCIL BEAM INTERFEROMETER; PROFILE MEASUREMENT; SYNCHROTRON-RADIATION BEAM LINE;

FUSED SILICA;

EID: 84957512807     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.948082     Document Type: Conference Paper

References (9)

1. P. Z. Takacs, “Metrology of reflection optics for synchrotron radiation,” Nucl. Instr. Meths. in Phys. Res. A246, 227–241 (1986).
2. P. Z. Takacs and J. Colbert, “Evaluation techniques for x-ray mirrors and systems using visible light,” Nucl. Instr. Meths. in Phys. Res. A246, 223–226 (1986).
3. K. von Bieren, “Pencil beam interferometer for aspherical optical surfaces,” in Laser Diagnostics, Proc. SPIE 343, 101–108 (1982).
4. K. von Bieren, “Interferometry of wavefronts reflected off conical surfaces,” Appl. Opt. 22, 2109 (1983).
5. P. Z. Takacs, S.-N. Qian, and J. Colbert, “Design of a long-trace surface profiler,” in Metrology-Figure and Finish, Bruce Truax, ed., Proc. SPIE 749, 59–64 (1987).
6. J. W. Goodman, Introduction to Fourier Optics, McGraw Hill, San Francisco (1968).
7. J. D. Gaskill, Linear Systems, Fourier Transforms, and Optics, John Wiley and Sons, New York (1978).
8. G. P. Williams, M. Howells, N. Lucas and P. Z. Takacs, “Resolution and output studies on the NSLS U14 Plane Grating Monochromator,” Nucl. Instr. and Meths. 222, 99–102 (1984).
9. E. L. Church and P. Z. Takacs, “Use of an optical-profiling instrument for the measurement of the figure and finish of optical-quality surfaces,” WEAR 109, 241–257 (1986).