X-ray tomography with micrometer spatial resolution

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3149, Issue , 1997, Pages 140-148

  Raven, Carsten ^a   Snigirev, Anatoly A ^a   Koch, Andreas ^a   Snigireva, Irina ^a   Kohn, Victor ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; DIAGNOSTIC RADIOGRAPHY; IMAGE RESOLUTION; IMAGING SYSTEMS; LIGHT; MEDICAL IMAGING; MICROMETERS; ORGANIC POLYMERS; REFRACTIVE INDEX; THICKNESS MEASUREMENT; THREE DIMENSIONAL; TOMOGRAPHY;

HIGH ENERGIES; INDEX DISTRIBUTION; LIGHT MICROSCOPES; MICRO TOMOGRAPHY; MICROMETER RESOLUTION; NORMAL PRESSURE; ROOM-TEMPERATURE (RT); SOFT X RAY (SXR); SPATIAL RESOLUTION (SR); SYNCHROTRON SOURCES; THIRD GENERATION (3G); TOMOGRAPHIC IMAGING; WAVE FIELDS; X RAY TOMOGRAPHY;

X RAYS;

EID: 0000003870     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.292719     Document Type: Conference Paper

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