Focusing properties of x-ray spectrometers with 2D-curved crystals for extended x-ray sources of hot plasmas

Journal of X-Ray Science and Technology

Volumn 7, Issue 2, 1997, Pages 171-185

  Fraenkel, B S ^a   Bitter, M ^b   Von Goeler, S ^b   Hill, K ^b  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b PRINCETON PLASMA PHYSICS LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CRYSTALS; FOCUSING; FUSION REACTIONS; PLASMA DIAGNOSTICS;

DOPPLER BROADENING MEASUREMENTS; EXTENDED X RAY SOURCES;

X RAY SPECTROMETERS;

EID: 0031167614     PISSN: 08953996     EISSN: None     Source Type: Journal    
DOI: 10.1006/jxra.1997.0245     Document Type: Article

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